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Related lectures (5)
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Design for Testability: Techniques and Hardware
Explores DFT techniques, scan design, JTAG boundary scan, and system test logic.
Design for Testability: Techniques and Methods
Explores Design for Testability techniques in VLSI systems, covering ad-hoc and structured methods, scan design, and modern testing standards.
VLSI Testing: Techniques and Economics
Explores test techniques for digital VLSI systems, covering fault modeling, test-pattern generation, and design for testability.
Debug with CCS: Microcontrollers Understanding
Explores programming and debugging microcontrollers using Code Composer Studio.
Test of VLSI Systems: Combinational and Sequential ATPG
Covers the generation of test vector patterns, fault modeling, structural vs. functional tests, and the implementation of time-frame expansion.
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