Lectures related to Xorshift | EPFL Graph Search

Test of VLSI Systems: BIST and Response Compaction

Covers BIST techniques, LFSRs, Response Compaction, MISR, and BILBO in VLSI systems.

Built-In Self-Test (BIST): Techniques and Implementations

Explores Built-In Self-Test (BIST) techniques in VLSI systems, covering benefits, drawbacks, implementation details, and the use of Linear Feedback Shift Registers (LFSRs) for test pattern generation.

Signal in Space Construction

Explores the construction of signals in space for satellite positioning systems, including navigation data, channel coding, and spreading modulation.

Random Number Generators: Schrage's Algorithm

Explores Schrage's algorithm for generating random numbers and shift-register generators in computers.

Random Number Generators: Algorithms and Generators

Explores portable and non-portable random number generation algorithms and the shift-register generator concept.

Logic Gates and Hazard Elimination

Explores logic gates, hazard elimination, ALUs, counters, and shift registers in semiconductor technology.