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Related publications (27)

Multiple phase estimation via signal separation using a windowed Fourier transform in digital holographic interferometry

Pramod Rastogi, Rishikesh Dilip Kulkarni

This paper proposes a novel method for the simultaneous estimation of multiple interference phases from a single recording of the interference field in a multi-wave digital holographic interferometry set-up. The method involves the separation of signal com ...

Institute of Physics2015

BSIM6: Analog and RF Compact Model for Bulk MOSFET

Christian Enz, Yogesh Singh Chauhan, Maria-Anna Chalkiadaki, Sourabh Khandelwal

BSIM6 is the latest industry-standard bulk MOSFET model from the BSIM group developed specially for accurate analog and RF circuit designs. The popular real-device effects have been brought from BSIM4. The model shows excellent source-drain symmetry during ...

Institute of Electrical and Electronics Engineers2014

Simultaneous measurement of in-plane and out-of-plane displacements using pseudo-Wigner-Hough transform

Pramod Rastogi, Rishikesh Dilip Kulkarni

A new method based on pseudo-Wigner-Hough transform is proposed for the simultaneous measurement of the in-plane and out-of-plane displacements using digital holographic moire. Multiple interference phases corresponding to the in-plane and out-of-plane dis ...

Optical Society of America2014

Carbon Nanotube Precise Assembly for CMOS and NEMS Applications

Ji Cao

As complementary metal–oxide–semiconductor (CMOS) scaling meets fundamental limitations, revolutionary device concepts and materials are urgently needed as alternatives or supplements to CMOS technology. Carbon nanotubes (CNTs), featuring extraordinary phy ...

EPFL2013

Precise Alignment of Individual Carbon Nanotubes for Nanoelectronics

Mihai Adrian Ionescu, Ji Cao

We report optimized precise alignment of individual single-walled carbon nanotubes (SWCNTs) by the resist-assisted AC-dielectrophoresis (DEP) method. We can reproducibly control the alignment precision to sub-50 nm by customizing the critical DEP parameter ...

IEEE2012

Accelerating Range Queries For Brain Simulations

Anastasia Ailamaki, Henry Markram, Felix Schürmann, Thomas Heinis, Farhan Tauheed, Laurynas Biveinis

Neuroscientists increasingly use computational tools to build and simulate models of the brain. The amounts of data involved in these simulations are immense and the importance of their efficient management is primordial. One particular problem in analyzin ...

2012

AC analysis of defect cross sections using non-radiative MPA quantum model

Alexandre Schmid, Yusuf Leblebici, Davide Garetto

A multiphonon-assisted model included in a Poisson-Schroedinger solver has been applied for the calculation of the capture/emission trapping rates of Si/SiO2 interface defects and their dependence with respect to the trap energy and depth in the oxide. The ...

2011

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