Concept

Transmission electron microscopy

Related lectures (32)

Analytical Electron Microscopy: Spectroscopy and Microanalysis

Explores Analytical Electron Microscopy techniques for chemical analysis using EELS and EDX.

Introduces the basics of Transmission Electron Microscopy, covering TEM user interface, camera settings, vacuum overview, and image analysis.

Microscopic Analyses & Electron Sources

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

Scanning Electron Microscopy

Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.

Beam-Matter Interactions

Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.

Transmission Electron Microscopy: basics

Covers the principles, applications, and components of Transmission Electron Microscopy (TEM), including imaging modes and advanced techniques.

Electron Microscopy: Components and Operation

Explores the history and operation of electron microscopes, focusing on components and resolving power.

Advanced SEM & FIB

Explores advanced SEM techniques and FIB technology for imaging and sample preparation.

Introduction and Interaction with Radiation-Matter

Introduces electron microscopy, covering practical organization, sample preparation, radiation-matter interaction, and detector mechanisms.

Sample Preparation: Techniques and Methods

Discusses the importance of sample preparation in electron microscopy and various techniques involved.

Introduction to TEM

Covers the basics of transmission electron microscopy, including components, operation, imaging modes, diffraction analysis, and the interaction of high-energy electrons with matter.

Improving Electron Microscope Capabilities: Cold Field Emission Source

Delves into designing a new cold field emission electron source for improved electron microscope capabilities.