Lectures related to Vicia faba

Introduces the basics of Transmission Electron Microscopy, covering TEM user interface, camera settings, vacuum overview, and image analysis.

Covers beams with distributed and concentrated forces, bending moment, shear force, and internal load diagrams.

Explores beam bending, stiffness, and curvature in mechanical systems using OCR-extracted slides from EPFL's Spring 2021 session.

Covers the basics of structural mechanics, emphasizing static structures and truss analysis.