Publications related to Mean signed deviation

A Downscaling Intercomparison Study: The Representation of Slope- and Ridge-Scale Processes in Models of Different Complexity

Varun Sharma, Franziska Gerber, Albertus Christiaan Kruyt, Dylan Stewart Reynolds

Spatially distributed meteorological information at the slope scale is relevant for many processes in complex terrain, yet information at this sub-km spatial resolution is difficult to obtain. While downscaling to kilometer resolutions is well described in ...

FRONTIERS MEDIA SA2022

Growth kinetics of Al-Fe intermetallic compounds during annealing treatment of friction stir lap welds

Hossein Najafi

In this study, we explored the growth kinetics of the Al-Fe intermetallic (IM) layer at the joint interface of the St-12/Al-5083 friction stir lap welds during post-weld annealing treatment at 350, 400 and 450 degrees C for 30 to 180 mm. Optical microscope ...

Elsevier Science Inc2014

OFDM Channel Estimation Based on Impulse Response Decimation: Analysis and Novel Algorithms

Stefano Rosati

In this paper, OFDM data-aided channel estimation based on the decimation of the Channel Impulse Response (CIR) through the selection of the Most Significant Samples (MSS) is addressed. Our aim is to approach the Minimum Mean Square Error (MMSE) channel es ...

Institute of Electrical and Electronics Engineers2012

Effects of noise in different approaches for the statistics of polariton condensates

Paolo Schwendimann, Antonio Quattropani, Davide Sarchi

The second-order correlation function of the polariton condensate is calculated within two different approaches. Both approaches qualitatively reproduce the deviations from the full coherence of the second-order correlation function that have been observed ...

2008

Effects of strain and composition on the lattice parameters and applicability of Vegard's rule in Al-rich Al1-xInxN films grown on sapphire

Nicolas Grandjean, Jean-François Carlin, Eric Feltin, Marcus Gonschorek

The lattice parameters and strain evolution in Al1-xInxN films with 0.07

2008

Blind optimization of algorithm parameters for signal denoising by Monte-Carlo sure

Michaël Unser, Thierry Blu, Sathish Ramani

We consider the problem of optimizing the parameters of an arbitrary denoising algorithm by minimizing Stein's Unbiased Risk Estimate (SURE) which provides a means of assessing the true mean-squared-error (MSE) purely from the measured data assuming that i ...

Ieee Service Center, 445 Hoes Lane, Po Box 1331, Piscataway, Nj 08855-1331 Usa2008

Monte-Carlo SURE: A Black-Box Optimization of Regularization Parameters for General Denoising Algorithms

Michaël Unser, Thierry Blu, Sathish Ramani

We consider the problem of optimizing the parameters of a given denoising algorithm for restoration of a signal corrupted by white Gaussian noise. To achieve this, we propose to minimize Stein's unbiased risk estimate (SURE) which provides a means of asses ...

IEEE2008