Concept

Very Large Scale Integration

Related lectures (32)

Covers the fundamentals of VLSI design, focusing on circuit optimization and complex system composition.

Explores the backend design flow in semicustom ASIC design, covering layout, clock tree generation, and tapeout preparation.

Testing of VLSI Systems

Explores defects, errors, and fault models in VLSI systems, emphasizing fault collapsing and dominance.

SRAM: Peripherals and Noise Margin

Covers the operation of SRAM, focusing on peripherals and noise margin.

Test Environment Setup

Covers the setup of a test environment for VLSI design.

Quantum Optomechanics: Manipulating Light and Matter

Explores cavity quantum optomechanics, manipulating light and matter at different scales, enabling new technologies and sensing capabilities.

PVT Variations, Uncertainty, and Monte-Carlo Simulations

Explores the impact of PVT variations, uncertainties in IC design, worst-case design paradigms, and the importance of Monte-Carlo simulations.

Fading Channels: Model & Performance

Covers fading channels in wireless communication, discussing models, performance, diversity, and attenuation effects.

SRAM Memory Architecture

Covers the fundamentals of VLSI design related to SRAM and memory arrays for better density.

Introduction to Advanced VLSI Design

Covers Advanced VLSI Design concepts, including Full Custom Design and Parallel Prefix Adder.

Thermal Sensors: Silicon Resistors

Explores the use of silicon resistors as thermal sensors and diode-based thermometers, discussing temperature-resistance relationships and differential measurements.

Path-Delay Fault Testing

Covers linked and unlinked faults in VLSI systems, March test algorithms, critical paths, and path-delay fault testing.