Explores the interaction of radiation with matter, covering ionization, excitation, deexcitation, bremsstrahlung, Cherenkov radiation, and stopping power.
Covers the basics of Scanning Electron Microscopy, including electron-sample interactions, detectors, sample preparation, image formation, resolution, and contrasts in SEM images.
Explores surface analysis methods using electrons, ions, atoms, and photons, emphasizing the importance of ToF-SIMS for in-depth surface analysis in various fields.
Introduces EBSD and ESEM, covering acquisition, sample preparation, indexing, applications, and data analysis, along with the operation and benefits of ESEM.
