Explores applications of micron and submicron focusing, crystallography, and tomographic reconstructions in beamlines, as well as the need for secondary optics and different types of lenses.
Explores large-area sensors for X-ray detection, covering direct and indirect methods, detector performance metrics, and active matrix flat panel imagers.
Explores the historical perspective, properties, and applications of X-rays, including diffraction, atomic resolution, and spectral colors of elements.
