Lectures related to JTAG | EPFL Graph Search

Explores DFT techniques, scan design, JTAG boundary scan, and system test logic.

Explores programming and debugging microcontrollers using Code Composer Studio.

Explores Design for Testability techniques in VLSI systems, covering ad-hoc and structured methods, scan design, and modern testing standards.

Covers BIST techniques, LFSRs, Response Compaction, MISR, and BILBO in VLSI systems.