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Introduces the concept of measuring in various domains, focusing on electrical, optical, and microscale measurements.
Introduces the concept of metrology, covering electrical, optical, and quantum measurements, with insights into the history and evolution of the International System of Units.
Covers nanoscale metrology, optical microscopy, atomic force microscopy, electron microscopy, and the redefinition of units.
Explores the history, applications, measurement science, radiation-matter interaction, and fundamental forces in radiation detection.
Explores physics scales, measurements, historical definitions of meter and kilogram, time definition, and scalars and vectors.
Introduces quantum sensing and metrology, exploring precision limitations and unified frameworks for analysis with elementary quantum systems.
Introduces practical metrology experiments, covering topics like quantum metrology, single-photon experiments, and AFM for nanoscale measurements.
Explores MEMS inspection and metrology techniques in cleanroom environments for validating device functionality and meeting design specifications.
Explores electrical metrology, covering random variables, noise sources, and their impact on electronic devices.
