Covers X-Ray Photoelectron Spectrometry (XPS), a surface analysis technique developed by Kai Siegbahn, explaining its components, mechanism, and analysis methods.
Introduces the basics of heterogeneous catalysis, focusing on catalyst types, surface reactivity, and the role of surface energy in catalytic processes.
Covers the significance of surface properties in semiconductors and nanomaterials, including surface energy, reconstruction, and the effects of surface states on electronic behavior.
Explores surface analysis methods using electrons, ions, atoms, and photons, emphasizing the importance of ToF-SIMS for in-depth surface analysis in various fields.
