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Related lectures (8)
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Camera Calibration: Basics
Introduces camera calibration basics, including parameters estimation, pinhole model limitations, lens imaging, depth of field, and lens distortions.
Image Formation: Understanding 2D Projections from 3D Scenes
Explains the principles of image formation, covering light projection, digitization, and the pinhole camera model.
Machine Learning for Feature Extraction
Explores machine learning for feature extraction, 3D vision, and neural networks in mobile robotics.
Plenoptic Cameras: Techniques and Applications
Covers the principles and applications of plenoptic cameras and light field photography, including techniques for numerical refocusing and the evolution of camera technology.
Electron Microscope Components
Covers the components and technologies used in electron microscopy, including detectors, lenses, aberrations, and specimen holders.
Gaussian Beams: Properties and Applications
Explores Gaussian beams, beam quality, optical fibers, laser diode stacks, and mask projection systems.
STEM: Scanning Transmission Electron Microscopy
Explores Scanning Transmission Electron Microscopy (STEM) principles, detectors, contrast mechanisms, and applications in high-resolution imaging.
Beam Optics: Introduction and Applications
Covers beam optics, Gaussian beams, and wavefront curvature in various applications.
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