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EE-530: Test of VLSI systems
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Lectures in this course (22)
Design for Testability: Techniques and Methods
Explores Design for Testability techniques in VLSI systems, covering ad-hoc and structured methods, scan design, and modern testing standards.
Test of VLSI Systems: BIST and Response Compaction
Covers BIST techniques, LFSRs, Response Compaction, MISR, and BILBO in VLSI systems.
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