Course

MSE-352: Introduction to microscopy + Laboratory work

Lectures in this course (47)

Radiation-Matter Interaction: Electron Microscopy Introduction

Covers the principles and techniques of electron microscopy, focusing on the interaction between radiation and matter.

Introduction and Interaction with Radiation-Matter

Introduces electron microscopy, covering practical organization, sample preparation, radiation-matter interaction, and detector mechanisms.

Electron Microscope Components

Covers the components and technologies used in electron microscopy, including detectors, lenses, aberrations, and specimen holders.

Electron Microscopy Components

Covers electron microscope components, vacuum systems, aberrations, detectors, and specimen holders.

Scanning Electron Microscopy Basics

Covers the basics of Scanning Electron Microscopy, including working principles, image generation, signal production, and challenges.

SEM basics

Covers the basics of Scanning Electron Microscopy, including setup, signals, and challenges like beam damage and charging.

Scanning Electron Microscopy

Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.

Electron Microscopy: EDS

Explores Energy-Dispersive X-ray Spectroscopy (EDS) in electron microscopy, covering x-ray generation, detection, quantification, and mapping of elements in samples.

Advanced SEM & FIB

Explores advanced SEM techniques and FIB technology for imaging and sample preparation.

Scanning Electron Microscopy: Operation and Analysis

Explores the operation and analysis of a scanning electron microscope, covering SEM controls, detectors, image acquisition, spectra analysis, and software usage.

SmartSEM Operation Basics

Covers the basics of operating a SmartSEM system, including beam detection and image scanning.

Electron Microscopy: ESEM

Explores Electron Scanning Electron Microscopy (ESEM) for imaging samples in various environments and studying phase transitions.

Intermediate Electron Microscopy Test

Explores parameters impacting probe size in electron microscopy and different detectors for contrast optimization.

Electron Microscopy: EDS and ESEM

Explores EDS and ESEM principles, x-ray detection, ionization efficiency, Moseley's law, and ESEM sample environments.

3D FIB/SEM Volume Reconstruction

Explores 3D volume reconstruction using FIB/SEM microscopy, particle recognition, edge detection, watershed separation, and quantitative microstructure analysis.

FIB Applications: Nanofabrication and Failure Analysis

Explores Focused Ion Beam (FIB) applications in nanofabrication and failure analysis.

Focused Ion Beam: Basics

Covers the principles and applications of Focused Ion Beam microscopy and the advantages of using ions over electrons.

Sample Preparation for TEM Observation

Explores the methods and challenges of sample preparation for TEM observation, emphasizing the importance of size, composition, and safety measures.

Intermediate Electron Microscopy Test: Detectors and Probes

Discusses detectors in electron microscopy and probe size control.

Electron Microscopy: TEM

Introduces the principles of transmission electron microscopy (TEM) and its practical aspects.