Lectures in course MSE-352: Introduction to microscopy + Laboratory work

Covers adjusting brightness, contrast, applying filters, and analyzing Fourier transforms for image enhancement.

Demonstrates practical image processing for particle analysis using Fiji.

Covers image smoothing, noise reduction, and segmentation techniques using filters and transforms.

Covers inverse Fourier transform, frequency filtering, segmentation, thresholding, particle size estimation, and analysis using ImageJ.

Explores image processing techniques such as contrast manipulation, enhancement, and sharpening using Fiji software.

Explores electron microscopy in situ, covering time-resolved techniques and environmental TEM applications for SOFC.

Explores in situ electron microscopy applications, traction experiments, environmental effects, XRD, and EDS.