Covers Energy Dispersive X-ray Microanalysis, explaining how X-rays reveal elemental composition and discussing X-ray generation, detection, efficiency, and quantification.
Introduces EBSD and ESEM, covering acquisition, sample preparation, indexing, applications, and data analysis, along with the operation and benefits of ESEM.
Explores Environmental Scanning Electron Microscopy (ESEM) for imaging diverse samples without preparation, covering electron beam scanning, pressure manipulation, electron scattering, X-ray analysis, and phase transitions.
Explores the principles and applications of Focused Ion Beam technology, covering imaging, milling, TEM sample preparation, nanofabricated structures, and 3D microscopy.
