Covers electron microscopy techniques, components, and applications, including historical development, lens aberrations correction, and electron interaction with matter.
Covers the principles of scanning electron microscopy at high specimen chamber pressures and the microstructures of magnesium hydride catalyzed with Ni nano-particles or Nb2O5.
Covers the fundamentals of Scanning Probe Microscopy, including its history, principles, instruments, and applications in semiconductor research and industry.
Explores noise interference sources in electronic systems, covering thermal, magnetic, and electromagnetic fields, ground loops, and common resistance paths.
Explores reducing interference through shielding, grounding, and differential measurement, emphasizing the importance of proper amplification and interference reduction techniques.
