Covers the principles and applications of Transmission Electron Microscopy, including imaging, diffraction, contrast mechanisms, and in situ techniques.
Explains Bragg's law in Transmission Electron Microscopy, focusing on the relationship between wavelength, crystal lattice spacing, and diffraction angle.
Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
Explores Transmission Electron Microscopy (TEM) principles, contrast mechanisms, dislocation identification, and sample cleaning methods for accurate imaging.
Covers electron microscopy techniques, components, and applications, including historical development, lens aberrations correction, and electron interaction with matter.
Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.
