Introduces fundamental optics concepts, covering refraction, reflection, interference, polarization, and more, exploring the behavior of light in different media.
Covers electron microscopy techniques, components, and applications, including historical development, lens aberrations correction, and electron interaction with matter.
Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.
Explores optical aberrations in microscopy, including spherical, chromatic, coma, astigmatism, and more, impacting image quality and correction methods.
Explores the transformation of spherical waves into converging ones using lenses and discusses Gaussian beams' properties and focusing of thermal sources.
Explores the components and operation of Transmission Electron Microscopy, covering vacuum systems, electron emission, lens aberrations, and detector types.
Explores HRTEM image formation through interference of transmitted and diffracted beams, covering contrast transfer function, aberration correction, and phase retrieval techniques.
