Explores the fundamentals and applications of High-Resolution Transmission Electron Microscopy, focusing on image formation, contrast transfer function, and optical system corrections.
Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
Explains Bragg's law in Transmission Electron Microscopy, focusing on the relationship between wavelength, crystal lattice spacing, and diffraction angle.