Lectures related to Test of VLSI Systems: ATPG and Fault Coverage

Explores defects, errors, and fault models in VLSI systems, emphasizing fault collapsing and dominance.

Logic Systems: Karnaugh Maps and TTL Gates

Explores Karnaugh maps, TTL gates, analog aspects of digital logic, and prime implicants.

Test of VLSI Systems: Combinational and Sequential ATPG

Covers the generation of test vector patterns, fault modeling, structural vs. functional tests, and the implementation of time-frame expansion.

Logic Synthesis: Designing Efficient Digital Circuits

Discusses logic synthesis techniques for designing efficient digital circuits using minterms, maxterms, and new gates like XOR and XNOR.

Logical Effort: Fundamentals of VLSI Design

Covers the Logical Effort method for optimizing logic delay and gate sizing impact.

Logic Systems: TTL Gates and Analog Aspects

Explores TTL gates, analog aspects, and various logic gates in digital circuits.

Path-Delay Fault Testing

Covers linked and unlinked faults in VLSI systems, March test algorithms, critical paths, and path-delay fault testing.

Design for Testability: Techniques and Hardware

Explores DFT techniques, scan design, JTAG boundary scan, and system test logic.

Introduction to Logisim Evolution: Basics of Digital Circuit Design

Introduces Logisim Evolution, focusing on basic components for digital circuit design.

Logic Synthesis: Designing Efficient Digital Circuits

Discusses logic synthesis techniques for designing efficient digital circuits from functional descriptions and truth tables.

Karnaugh Maps: Grouping Techniques

Explores Karnaugh maps, grouping rules, and transistor logic in logic systems.

Software Quality: Managing Defects and Testing Strategies

Explores managing defects, testing strategies, and challenges in software quality, with real-world examples and case studies.

Software Testing: Avoiding and Fixing Bugs

Emphasizes the critical role of software testing in preventing and resolving bugs during development.

Circuits in Emerging Nanotechnologies

Explores the challenges and opportunities in emerging nanotechnologies, focusing on new memory technologies and the need for architectural innovations.

VLSI Testing: Techniques and Economics

Explores test techniques for digital VLSI systems, covering fault modeling, test-pattern generation, and design for testability.

Complex Gates: Exercise-2 Solution

Covers the design of complex logic gates in VLSI.

Property-Based Testing: Advanced Techniques

Explores advanced software testing techniques, including property-based testing, to ensure code correctness and improve software quality.

Property-Based Testing: Advanced Techniques and Applications

Explores advanced software testing techniques, including property-based testing and various forms of fuzzing, to effectively test complex systems.

Property-Based Testing: QuickChick

Explores property-based testing using QuickChick, focusing on software correctness, specifications, and dynamic information flow control.

Software Development: Debugging, Testing, and Code Management

Explores program development, debugging, testing, and code management best practices for reliable software.