Design for Testability: Techniques and Hardware

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Related lectures (31)

Test of VLSI Systems: Combinational and Sequential ATPG

Covers the generation of test vector patterns, fault modeling, structural vs. functional tests, and the implementation of time-frame expansion.

Debugging

Covers testing, TDD, coverage, debugging, naming conventions, comments, and solutions for coding issues.

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Sequential Logic Circuits in VHDL

Covers modeling sequential logic circuits in VHDL, including processes, control instructions, flip-flops, counters, and registers.

Equipment Key Users Module Presentation

Covers the presentation of the equipment key users module and its focus on planning, data loading, and integration tests.

Digital Circuits: Logic Basics

Introduces digital circuits, covering binary systems, logic operators, Boolean algebra, memory elements, and practical examples like BCD decoders and shift registers.

Software Development: Debugging, Testing, and Code Management

Explores program development, debugging, testing, and code management best practices for reliable software.

Property-Based Testing: Advanced Techniques

Explores advanced software testing techniques, including property-based testing, to ensure code correctness and improve software quality.

Property-Based Testing: Advanced Techniques and Applications

Explores advanced software testing techniques, including property-based testing and various forms of fuzzing, to effectively test complex systems.

Test of VLSI Systems

Covers test techniques for digital VLSI systems, including fault modeling and design for testability.

Logic Gates and IC Technology

Explores the implementation of logic gates in semiconductor material, focusing on TTL and CMOS technologies, ICs, hazards, clocks, D flip-flops, and switch debouncing.

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