Lecture

Electron Tomography

Related lectures (32)

Explores principles and applications of tomography, including 3D microscopy techniques and atomic-level material reconstruction.

Tomography: Principles and Applications

Explores the principles and applications of tomography, covering X-ray computed tomography, electron tomography, and advanced techniques.

Microscopic Analyses & Electron Sources

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

Microscopy: General Aspects and Techniques

Covers general aspects and techniques of microscopy, emphasizing resolution importance and exploring scanning tunneling and atomic force microscopy.

Radiation-Matter Interaction: Electron Microscopy Introduction

Covers the principles and techniques of electron microscopy, focusing on the interaction between radiation and matter.

Microscopy at Nanoscale: Techniques and Applications

Covers resolution enhancement in optical microscopy, confocal imaging, and fluorescent labelling, exploring the history and techniques of scanning probe microscopy.

Introduction and Interaction with Radiation-Matter

Introduces electron microscopy, covering practical organization, sample preparation, radiation-matter interaction, and detector mechanisms.

Checking Probes-layer quality

Covers quality assessment of probes-layers using Resonant Mirror, Surface Plasmon Resonance, and Scanning Electron Microscopy.

Tomography: Imaging by Sections

Covers the method of reconstructing 3D structures from 2D projections in various scientific fields.

Electron Microscopy: Instrumentation in Life Sciences

Explores electron microscopy instrumentation in life sciences, covering techniques, instrument limitations, components, specimen preparation, beam interactions, and contrast functions.

Atomic Resolution Techniques

Covers synchrotrons, x-ray lasers, and atomic resolution techniques like Cryo-EM and scanning tunneling microscopy.

STEM: Scanning Transmission Electron Microscopy

Explores Scanning Transmission Electron Microscopy (STEM) principles, detectors, contrast mechanisms, and applications in high-resolution imaging.

High Resolution He Ion Microscopy

Covers the ALIS He ion source and its application in high resolution microscopy, providing remarkable surface detail and material contrast.

Polymer Morphological Characterization Techniques: Introduction

Introduces polymer morphological characterization techniques, emphasizing the overlap between organic materials science and biosciences.

Introduction to Metrology

Covers nanoscale metrology, optical microscopy, atomic force microscopy, electron microscopy, and the redefinition of units.

Sample Preparation Techniques

Explores sample preparation techniques for TEM, such as cleaved wedge method and ultramicrotomy, highlighting their importance in obtaining high-quality samples.

Tomography: Principles and Applications

Explores the principles and applications of tomography, showcasing examples of direct tomography and advanced imaging techniques.

Electron Microscopy: In Situ

Explores electron microscopy in situ, including time-resolved techniques and environmental TEM applications.

Electron Microscopy: In Situ

Explores electron microscopy in situ, covering time-resolved techniques and environmental TEM applications for SOFC.

STEM: Scanning Transmission Electron Microscopy

Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.