Explores dynamical scattering in electron diffraction, discussing challenges in interpreting diffraction patterns and applications in crystal defect imaging and phase discrimination.
Explores the historical perspective, properties, and applications of X-rays, including diffraction, atomic resolution, and spectral colors of elements.
Explores Fresnel diffraction, Fraunhofer diffraction, the Babinet principle, and optical microscope resolution, as well as near-field microscopy and SNOM/NSOM imaging.
Analyzes interference patterns from a device with six slits to determine the relation between slit width and distance, showcasing mathematical expressions and graphical representations.
