Explores laser fundamentals, noise sources, and beam steering technologies using optical fibers and ultrafast lasers.
Explores electrical metrology, covering random variables, noise sources, and their impact on electronic devices.
Explores achievable rate, channel capacity, spectral efficiency, and fading channels in wireless communication systems.
Explores noise sources in data acquisition, including thermal, shot, and amplifier noise, as well as the effects of ADC noise.
Covers strategies to combat noise sources in electronics measurements and explores techniques to mitigate noise and improve measurement accuracy.
