Introduces dynamical scattering in TEM, covering single and multiple elastic scattering, 2-beam diffraction, Bloch wave theory, and scattering intensity.
Covers the principles and applications of Transmission Electron Microscopy, including imaging, diffraction, contrast mechanisms, and in situ techniques.
Explains Bragg's law in Transmission Electron Microscopy, focusing on the relationship between wavelength, crystal lattice spacing, and diffraction angle.
Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
Explores Transmission Electron Microscopy (TEM) principles, contrast mechanisms, dislocation identification, and sample cleaning methods for accurate imaging.
Covers the basics of transmission electron microscopy, including components, operation, imaging modes, diffraction analysis, and the interaction of high-energy electrons with matter.
