Covers test techniques for digital VLSI systems, including fault modeling and design for testability.
Explores practical aspects of solving parity games, including winning strategies, algorithms, complexity, determinism, and heuristic approaches.
Explores defects, errors, and faults in VLSI systems, including fault models and testing challenges.
Covers linked and unlinked faults in VLSI systems, March test algorithms, critical paths, and path-delay fault testing.
Covers coin rendering and the limitations of the greedy algorithm in finding optimal solutions.
