Physics of Life: AFM

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Related lectures (32)

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Covers the fundamentals of tunneling current and conductance quantization in nanoscale phenomena.

Checking Probes-layer quality

Covers quality assessment of probes-layers using Resonant Mirror, Surface Plasmon Resonance, and Scanning Electron Microscopy.

Scanning Probe Microscopy: Basics and Applications

Covers Scanning Probe Microscopy basics, tip fabrication, and nano-tip microfabrication for nanoscale imaging and manipulation.

Microscopic Analyses & Electron Sources

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

Scanning Probe Microscopy: AFM Basics

Covers the basics of scanning probe microscopy, with a focus on the Atomic Force Microscope (AFM) and its operational principles.

Nanotechnology: Fabrication and Imaging

Covers advanced lithography, nanoscale imaging, and fabrication techniques in nanotechnology.

Scanning Probe Microscopy: Fundamentals and Applications

Explores the fundamentals and applications of scanning probe microscopy techniques, including AFM, MFM, KPFM, and SNOM.

Biomicroscopy II: Logistics

Covers theory and hands-on experience with optical microscopes and advanced microscopy methods.

Optical Microscopy: Concepts and Applications

Explores optical microscopy principles, techniques, resolution limits, and Nobel Prize-winning advancements in microscopy.

Nanoscale AFM: Microscopy and Techniques

Covers the principles and applications of Atomic Force Microscopy (AFM) for nanoscale metrology, including imaging modes, tip-sample interactions, and image processing.

STEM: Scanning Transmission Electron Microscopy

Explores Scanning Transmission Electron Microscopy (STEM) principles, detectors, contrast mechanisms, and applications in high-resolution imaging.

Scanning Probe Microscopy: Advanced Modes

Explores advanced modes of AFM, high-speed imaging, MEM, SNOM, and a variety of SPM techniques.

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