Explores the revision of the International System of Units, focusing on the kilogram, ampere, kelvin, and mole, and the impact on scientific measurements.
Covers resolution enhancement in optical microscopy, confocal imaging, and fluorescent labelling, exploring the history and techniques of scanning probe microscopy.
Explores 3D Microscopy and Tomography techniques, including Atom Probe Tomography and Field Emission Microscopy, emphasizing electron tomography principles and applications.
Covers the fundamentals of continuous circuits, including physical quantities, conductors, semiconductors, open and closed circuits, and electric power.
