Explores the failure mechanisms in MEMS devices, including creep, fatigue, and electrical failures, and discusses mitigation strategies.
Explores the limitations of ohmic heating in plasma and the advantages and drawbacks of neutral beam injection for additional plasma heating.
Covers magnetic reconnection, rising flux tubes, the Sweet-Parker model, energy balance, and open questions in plasma physics.
Explores electric fields, energy storage, charge displacement, DC currents, and historical aspects of electricity.
