Delves into probability, statistics, paradoxes, and random variables, showcasing their real-world applications and properties.
Explores noise sources in data acquisition, including thermal, shot, and amplifier noise, as well as the effects of ADC noise.
Covers the properties and construction of Poisson processes from i.i.d. Exp(X) random variables, emphasizing the importance of the process rate and jump time distributions.
Explores noise in optical receivers, covering shot noise, thermal noise, signal-to-noise ratio, and noise limits.
Explores noise in microelectronics, covering statistical characteristics, noise spectrum impact on circuits, and noise reduction techniques.
