Explores imaging modes in TEM, covering electron-matter interactions, diffraction patterns, image formation, contrast principles, and detector configurations.
Explores imaging modes in TEM, covering electron interactions, diffraction, contrast formation, and astigmatism correction.
Explores High Resolution Transmission Electron Microscopy principles, including contrast transfer, image formation, and Cs correctors.
Covers the ALIS He ion source and its application in high resolution microscopy, providing remarkable surface detail and material contrast.
Covers advanced operation techniques for a Transmission Electron Microscope (TEM), including setting up the workset and fine-tuning the image.
