Introduces basic optical microscopy techniques, including phase contrast and dark-field microscopy, and discusses the challenges of artifact identification.
Explores the generation and interpretation of elliptically polarized light in microscopy, including contrast enhancement techniques and Differential Interference Contrast (DIC) microscopy.
Explores dark-field microscopy, highlighting its improved contrast, high sensitivity, and potential for high-resolution imaging in various scientific fields.
Covers high-resolution transmission electron microscopy imaging techniques, focusing on phase contrast, simulations, and the impact of aberrations on image interpretation.
