Testing of VLSI SystemsExplores defects, errors, and fault models in VLSI systems, emphasizing fault collapsing and dominance.
Path-Delay Fault TestingCovers linked and unlinked faults in VLSI systems, March test algorithms, critical paths, and path-delay fault testing.
Digital Circuits: Logic BasicsIntroduces digital circuits, covering binary systems, logic operators, Boolean algebra, memory elements, and practical examples like BCD decoders and shift registers.
Static Timing AnalysisExplores static timing analysis in digital system design, covering setup and hold time requirements, critical paths, and timing conditions.
Sequential Logic DesignsIntroduces clocked systems, sequential circuits, bistable-state devices, metastable states, and D-type flip-flops.