Noise in Data AcquisitionExplores noise sources in data acquisition, including thermal, shot, and amplifier noise, as well as the effects of ADC noise.
Noise Calculation in CircuitsCovers noise analysis in circuits, including small-signal and input-referred noise, with examples of amplifiers and filters.
Electrical MetrologyExplores electrical metrology, covering random variables, noise sources, and their impact on electronic devices.
Observability and DualityDelves into the observability of LTI systems, covering controllability, duality, and observability tests.