Image AcquisitionCovers the basics of image acquisition, including optical devices, resolution factors, lens distortions, and sensor technologies.
Detectors: Cameras and PerformanceExplores imaging cameras' characteristics, spatial resolution, noise sources, and dynamic range for optimal performance in microscopy applications.
Electrical MetrologyExplores electrical metrology, covering random variables, noise sources, and their impact on electronic devices.
Stress-based Frequency TuningExplores stress-based frequency tuning in micro/nanomechanical devices, covering black body radiation, optical nonlinearity, NETD, and dynamic range.
Beamlines: DetectorsExplores the historical development and operation of various detector types and discusses the unique features of hybrid photon-counting detectors.
Electrical MetrologyExplores different types of noise in electrical systems and their impact on electronic devices.