Explores imaging cameras' characteristics, spatial resolution, noise sources, and dynamic range for optimal performance in microscopy applications.
Explores electrical metrology, covering random variables, noise sources, and their impact on electronic devices.
Explores different types of noise in electrical systems and their impact on electronic devices.
Covers image processing techniques including noise addition, filtering, and image enhancement using various filters and tools.
Covers strategies to combat noise sources in electronics measurements and explores techniques to mitigate noise and improve measurement accuracy.
Covers scientific image processing fundamentals, software practices, and ethical considerations in image processing.
Explores laser fundamentals, noise sources, and beam steering technologies using optical fibers and ultrafast lasers.
Covers the basics of image processing for microscopy, including acquiring, correcting defects, enhancing images, and extracting information.
