Introduces the concept of metrology, covering electrical, optical, and quantum measurements, with insights into the history and evolution of the International System of Units.
Covers the principles of single photon detection using Electron Multiplying Charge-Coupled Devices (EM-CCDs) and their applications in low-light imaging.
Covers the various architectures of Charge-Coupled Devices used in imaging systems, including full-frame, frame-transfer, and interline-transfer designs.
