Introduces basic optical microscopy techniques, including phase contrast and dark-field microscopy, and discusses the challenges of artifact identification.
Explores Fresnel diffraction, Fraunhofer diffraction, the Babinet principle, and optical microscope resolution, as well as near-field microscopy and SNOM/NSOM imaging.
Explores the fundamentals and applications of scanning probe microscopy, including STM setup, surface reconstruction, quantum tunneling, and scanning force microscopy.
