Explores Energy-Dispersive X-ray Spectroscopy (EDS) in electron microscopy, covering x-ray generation, detection, quantification, and mapping of elements in samples.
Covers X-Ray Photoelectron Spectrometry (XPS), a surface analysis technique developed by Kai Siegbahn, explaining its components, mechanism, and analysis methods.
Explores radiation sources, including fast electron sources, heavy charged particle sources, and neutron sources, covering processes like beta decay, internal conversion, and Auger electrons.
