Advanced SEM & FIBExplores advanced SEM techniques and FIB technology for imaging and sample preparation.
High Resolution He Ion MicroscopyCovers the ALIS He ion source and its application in high resolution microscopy, providing remarkable surface detail and material contrast.
Principle of SIMSExplains the principle of Secondary Ion Mass Spectrometry (SIMS) and its applications.
Sputtering: Ion Target InteractionsExamines ion-target interactions in PVD sputtering processes, covering compound deposition, surface damage, and factors influencing target ejection rates.
Microscopy Image AnalysisExplores light microscopy principles, fluorescent proteins, optical slicing, and modulation transfer functions in cellular imaging.