Explores imaging modes in TEM, covering electron interactions, diffraction, contrast formation, and astigmatism correction.
Explores applications of micron and submicron focusing, crystallography, and tomographic reconstructions in beamlines, as well as the need for secondary optics and different types of lenses.
Explores X-ray imaging techniques in synchrotron science, covering various scales and structural complexities of materials.
Explores phase contrast microscopy, a technique for label-free high-contrast imaging of transparent samples developed in the 1930s by Frits Zernike.
Explores the basics of X-ray imaging, including the discovery of X-rays, electromagnetic radiation interaction, and ionizing radiation effects.
