Explores noise sources in data acquisition, including thermal, shot, and amplifier noise, as well as the effects of ADC noise.
Covers noise analysis in circuits, including small-signal and input-referred noise, with examples of amplifiers and filters.
Explores electrical metrology, covering random variables, noise sources, and their impact on electronic devices.
Explores electronic, thermomechanical, and amplifier noise, calibration of amplitude, frequency tracking, and system limits.
Explores noise in optical receivers, covering shot noise, thermal noise, signal-to-noise ratio, and noise limits.
