Lecture

Testing of VLSI Systems

Related lectures (32)

Test of VLSI Systems

Covers test techniques for digital VLSI systems, including fault modeling and design for testability.

Explores defects, errors, and fault models in VLSI systems, emphasizing fault collapsing and dominance.

Logical Effort: Fundamentals of VLSI Design

Covers the Logical Effort method for optimizing logic delay and gate sizing impact.

Semiconductor Devices II: Defects Engineering

Covers the analysis of measurements and defects engineering in semiconductor devices, including density of states and defect probing.

VLSI Testing: Techniques and Economics

Explores test techniques for digital VLSI systems, covering fault modeling, test-pattern generation, and design for testability.

Simulation of 2D Field Effect Transistors

Covers the simulation of 2D Field Effect Transistors and the advantages of using Green's Function.

Logic Gates and IC Technology

Explores the implementation of logic gates in semiconductor material, focusing on TTL and CMOS technologies, ICs, hazards, clocks, D flip-flops, and switch debouncing.

Fracture Mechanics: Defects and Energy

Explores fracture mechanics, defects, stress factors, and energy release in material fracture.

Configurational Forces: Defects in Materials

Explores configurational forces in materials, emphasizing equilibrium conditions and defect interactions.

Materials Modelling: From Prediction to Design

Explores materials modelling, focusing on predicting and designing material properties through computation, including defect analysis, coherence time calculations, and quantum simulations.

Organic Electronics: Electronic Perturbations and Semiconductor Devices

Explores challenges and advancements in organic electronics, covering transport, semiconductor devices, and quantum harmonic oscillators.

Organic Electronic Materials

Explores the fundamentals and advancements in organic electronic materials, covering topics like electron delocalization, charge transport, semiconductor preparation, and sustainable engineering.

Sales Contracts: Definition, Risks, and Remedies

Explores sales contracts, warranty, form requirements, representations, and warranties, and the legal implications of defects in purchased items.

Semicustom RTL Design: Design Flow and Standard Cells

Explores the RTL design flow, chip-level integration, standard cells, and static timing analysis in VLSI design.

Ceramics: Thermal Stresses and Mechanical Resistance

Explores thermal stresses and mechanical resistance of ceramics, including the impact of temperature changes and the formation of cracks.

Defects in Electronic Materials

Delves into the impact of defects in electronic materials, exploring band tails, XPS analysis, and defect creation mechanisms.

Semiconductor Devices II: Contact Resistance Modeling

Explores contact resistance modeling in semiconductor devices, focusing on gate voltage calculation and defect analysis.

Logic Systems: TTL Gates and Analog Aspects

Explores TTL gates, analog aspects, and various logic gates in digital circuits.

Legal Aspects of Architectural Contracts

Explores the legal framework of architectural contracts, emphasizing the importance of understanding obligations and responsibilities in construction projects.

Photodiodes: Operation and Characteristics

Explores the operation and characteristics of photodiodes, including load resistance, junction capacitance, and sensitivity.