Introduces camera calibration basics, including parameters estimation, pinhole model limitations, lens imaging, depth of field, and lens distortions.
Covers the basics of image acquisition, including optical devices, resolution factors, lens distortions, and sensor technologies.
Covers the components and technologies used in electron microscopy, including detectors, lenses, aberrations, and specimen holders.
Covers the fundamental concepts of microscopy, explaining the need for magnification beyond the human eye and introducing advanced imaging techniques.
Covers critical and Kohler illumination, conjugate planes, and infinity corrected microscopes in microscopy.
Explains ray vectors, matrices, and properties of paraxial optical systems, with examples of conjugate matrices for thin lens imaging systems.
Introduces fundamental optics concepts, covering refraction, reflection, interference, polarization, and more, exploring the behavior of light in different media.
Explains ray optics principles, focusing on thin spherical lenses and object-image relationships.
