Simon Schneider

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Related publications (4)

Angular Resolved low loss EELS for Materials Characterization

Simon Schneider

Electron Energy Loss Spectrometry (EELS) in Transmission Electron Microscopy (TEM) is a powerful tool for the investigation of the electronic structure of materials. In the low loss regime, one can access the optical properties which are governed by the di ...

EPFL2013

Dynamic structure factors of Cu, Ag, and Au: Comparative study from first principles

Simon Schneider, Audrius Alkauskas, Cécile Hébert

We present a comparative theoretical and experimental study of dynamic structure factors (momentum-dependent loss functions) of the noble metals Cu, Ag, and Au in the energy range of 0-60 eV. The emphasis is on theoretical results that are compared with ne ...

Amer Physical Soc2013

Cathodoluminescence Mapping of Cherenkov-Radiation Generated Bloch-Modes in Planar Photonic Crystals by Fast Electrons

Romuald Houdré, Marco Cantoni, Simon Schneider, Nicolas Le Thomas, Cécile Hébert, Duncan Thomas Lindsay Alexander

Cambridge, Cambridge University Press2010

Theoretical analysis of the momentum-dependent loss function of bulk Ag

Simon Schneider, Audrius Alkauskas, Cécile Hébert

We analyze the momentum-dependent loss function of bulk silver, calculated via the random-phase approximation and based on the band structure from semi-local density functional theory calculations. In the energy range of 0-55 eV the spectrum reveals the ex ...

Elsevier2010

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