Publications by Milos Stanisavljevic

Multilevel-Cell Phase-Change Memory: A Viable Technology

Milos Stanisavljevic, Aravinthan Athmanathan, Evangelos Eleftheriou

In order for any non-volatile memory (NVM) to be considered a viable technology, its reliability should be verified at the array level. In particular, properties such as high endurance and at least moderate data retention are considered essential. Phase-ch ...

Ieee-Inst Electrical Electronics Engineers Inc2016

Compact Electro-Thermal Model for Thermal Cross-Talk Analysis in PCM Arrays

Yusuf Leblebici, Milos Stanisavljevic, Aravinthan Athmanathan, Abu Sebastian, Evangelos Eleftheriou

2013

Selective Redundancy-Based Design Techniques for the Minimization of Local Delay Variations

Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic

In this paper a novel approach to optimize digital integrated circuits yield with regards to speed and area/power for aggressive scaling technologies is presented. The technique is intended to reduce the effects of intra-die variations using redundancy app ...

IEEE Service Center2010

Output Probability Density Functions of Logic Circuits: Modeling and Fault-Tolerance Evaluation

Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic

The precise evaluation of the reliability of logic circuits has a significant importance in highly-defective and future nanotechnologies. It allows efficient comparison of fault-tolerance techniques, and enables designs improvement with respect to their re ...

IEEE Service Center2010

Optimization of Nanoelectronic Systems Reliability by Reducing Logic Depth

Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic

2009

On the Reliability of Post-CMOS and SET Systems

Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic

The necessity of applying fault-tolerant techniques to increase the reliability of future nano-electronic systems is an undisputed fact, dictated by the high density of faults that will plague these chips. The averaging and thresholding fault-tolerant tech ...

2009

Optimization of Nanoelectronic Systems Reliability under Massive Defect Density Using Distributed R-Fold Modular Redundancy

Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic

The theoretical analysis of R-fold modular redundancy with distributed voters - distributed R-fold modular redundancy in terms of reliability is presented for the first time to the best of author's knowledge. This technique is compared in terms of resistan ...

IEEE Computer Soc Press, Customer Service Center, Po Box 3014, 10662 Los Vaqueros Circle, Los Alamitos, Ca 90720-1264 Usa2009

Optimization of the Averaging Reliability Technique using Low Redundancy Factors for Nanoscale Technologies

Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic

This paper presents a method enabling the evaluation of the averaging fault-tolerant technique, using the output probability density functions (PDFs) of unreliable units which are acquired from Monte Carlo simulations. The method has been verified by compa ...

2009

On the dependability of nanoscale circuits and systems : methodologies and circuit architectures

Milos Stanisavljevic

The invention of the integrated circuit and the manufacturing progress as well as continuing progress in the manufacturing process are the fundamental engines for the implementation of all technologies that support today's information society. The vast maj ...

EPFL2009

Fault-Tolerance and Reliability of Post-CMOS Systems: a Circuit Perspective

Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic

The reliability of systems made of unreliable nanoelectronic devices is discussed in this paper. Massive defect density which may affect future fabrication technologies calls for novel solutions, where spatial redundancy and the voting scheme play a signif ...

IEEE Service Center, 445 Hoes Lane, Po Box 1331, Piscataway, Nj 08855-1331 Usa2009

An Enhanced Service Provider Communication Interface with Client Priorization

Slobodan Lukovic, Milos Stanisavljevic

With the increased dynamics of modern life, the efficiency and reliability of everyday services is emerging to be a fundamental concern. On the other hand, modern telecommunication technologies, like wireless Internet access, are penetrating all segments o ...

IEEE/WFM2008

Optimization of nanoelectronic systems' reliability under massive defect density using Cascaded R-fold modular redundancy

Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic

The theoretical analysis of R-fold modular redundancy, cascaded R-fold modular redundancy and NAND multiplexing is presented and these fault-tolerant techniques are compared in terms of resistance to massive levels of defect density. Optimal cluster size a ...

2008

Design and Realization of a Fault-Tolerant 90nm Cryptographic Engine Capable of Performing under Massive Defect Density

Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic, Maria Gabrani

This paper presents a new approach for assessing the reliability of nanometer-scale devices prior to fabrication and a practical reliability architecture realization. A four-layer architecture exhibiting a large immunity to permanent as well as random fail ...

ACM2007

Case Study of Fault-Tolerant Architectures for 90nm CMOS Cryptographic Cores

Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic, Maria Gabrani

This paper presents a case study of different fault-tolerant architectures. The emphasis is on the silicon realization. A 128bit AES cryptographic core has been designed and fabricated as a main topology on which the fault-tolerant architectures have been ...

2007

A 90nm CMOS Cryptographic Core with Improved Fault- Tolerance in Presence of Massive Defect Density

Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic

2007

Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density

Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic

An assessment of the fault-tolerance properties of single-ended and differential signaling is shown in the context of a high defect density environment, using a robust error-absorbing circuit architecture. A software tool based on Monte-Carlo simulations i ...

IEEE2006

A Methodology for Reliability Enhancement of Nanometer-Scale Digital Systems Based on A-Priori Functional Fault-Tolerance Analysis

Alexandre Schmid, Yusuf Leblebici, Vineet Abhishek, Milos Stanisavljevic

This paper presents a new approach for monitoring and estimating device reliability of nanometer-scale devices prior to fabrication. A four-layer architecture exhibiting a large immunity to permanent as well as random failures is used. A complete tool for ...

IFIP2005

Analysis of Reliability in Nano-Scale Circuits and Systems Based on A-Priori Statistical Fault-Modeling Methodology

Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic

This paper presents a new approach for monitoring and estimating device reliability of nanometer-scale devices prior to fabrication. A four-layer architecture exhibiting a large immunity to permanent as well as random failures is used. A complete Monte Car ...

IEEE2005