Yves Pétremand

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Related publications (5)

A miniature frequency-stabilized VCSEL system emitting at 795nm based on LTCC modules

Thomas Maeder, Nico de Rooij, Yves Pétremand, Fabrizio Vecchio

We present a compact frequency-stabilized laser system locked to the Rubidium absorption line of a micro-fabricated reference cell. A printed circuit board (PCB) is used to carry all the components and part of the electronics, and low-temperature co-fired ...

Elsevier2013

Low-temperature thin-film indium bonding for reliable wafer-level hermetic MEMS packaging

Nico de Rooij, Yves Pétremand, Danick Briand

This paper reports on low-temperature and hermetic thin-film indium bonding for wafer-level encapsulation and packaging of delicate and temperature sensitive devices. This indium-bonding technology enables bonding of surface materials commonly used in MEMS ...

Institute of Physics2013

Study of laser-pumped double-resonance clock signals using a microfabricated cell

Nico de Rooij, Yves Pétremand

We present our microwave spectroscopic studies on laser-microwave double-resonance (DR) signals obtained from a micro-fabricated Rb vapor cell. This study focuses on the characteristics and systematic shifts of the ground-state 'clock transition' in Rb-87 ...

2012

Microfabricated rubidium vapour cell with a thick glass core for small-scale atomic clock applications

Nico de Rooij, Yves Pétremand, Danick Briand

This paper presents a new fabrication method to manufacture alkali reference cells having dimensions larger than standard micromachined cells and smaller than glass-blown ones, for use in compact atomic devices such as vapour-cell atomic clocks or magnetom ...

Institute of Physics2012

Scalable cascaded snap-in actuators for large-stroke displacements

Nico de Rooij, Wilfried Noell, Yves Pétremand, Nicolas Bernard Golay

This paper will focus on the design, and first measurements of a cascaded in-plane parallel plate snap-in actuator. The actuator is based on a rather simple microfabrication process and can achieve a total displacement of several tenths of microns. Compare ...

2009

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