Publications by Maja Dukic Pjanic

Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe microscopy

Santiago Harald Andany, Georg Fantner, Maja Dukic Pjanic, Nahid Hosseini, Adrian Pascal Nievergelt, Chen Yang

Nearly all scanning probe microscopes (SPMs) contain a feedback controller, which is used to move the scanner in the direction of the z-axis in order to maintain a constant setpoint based on the tip-sample interaction. The most frequently used feedback con ...

2017

Probing the Morphology and Evolving Dynamics of 3D Printed Nanostructures Using High-Speed Atomic Force Microscopy

Georg Fantner, Maja Dukic Pjanic, Chen Yang, Jie Zhao

Focused electron beam induced deposition (FEBID) has been demonstrated as a promising solution for synthesizing truly three-dimensional (3D) nanostructures. However, the lack of morphological feedback during growth complicates further development toward hi ...

Amer Chemical Soc2017

Design of a high-bandwidth tripod scanner for high speed atomic force microscopy

Georg Fantner, Maja Dukic Pjanic, Nahid Hosseini, Chen Yang, Jie Zhao

Tip-scanning high-speed atomic force microscopes (HS-AFMs) have several advantages over their sample-scanning counterparts. Firstly, they can be used on samples of almost arbitrary size since the high imaging bandwidth of the system is immune to the added ...

2016

Advances in self-sensing techniques for atomic force microscopy

Maja Dukic Pjanic

Atomic force microscope (AFM) is a tool that allows micro and nano scale imaging of samples ranging from solid state physics to biology. AFM uses mechanical forces to sense the sample and recreate a topography image with high spatial resolution. The bigges ...

EPFL2016

Direct-write nanoscale printing of nanogranular tunnelling strain sensors for sub-micrometre cantilevers

Georg Fantner, Jonathan David Adams, Maja Dukic Pjanic

The sensitivity and detection speed of cantilever-based mechanical sensors increases drastically through size reduction. The need for such increased performance for high-speed nanocharacterization and bio-sensing, drives their sub-micrometre miniaturizatio ...

Nature Research2016

Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging

Georg Fantner, Jonathan David Adams, Maja Dukic Pjanic

Optical beam deflection (OBD) is the most prevalent method for measuring cantilever deflections in atomic force microscopy (AFM), mainly due to its excellent noise performance. In contrast, piezoresistive strain-sensing techniques provide benefits over OBD ...

Nature Publishing Group2015

High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

Georg Fantner, Blake William Erickson, Jonathan David Adams, Maja Dukic Pjanic, Adrian Pascal Nievergelt

We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the opt ...

2014

Focused electron beam induced deposition: A perspective

Georg Fantner, Jonathan David Adams, Maja Dukic Pjanic

Background: Focused electron beam induced deposition (FEBID) is a direct-writing technique with nanometer resolution, which has received strongly increasing attention within the last decade. In FEBID a precursor previously adsorbed on a substrate surface i ...

Beilstein-Institut2012